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Jul 10, 2020 - Ihlefeld Research Group
Ihlefeld, Jon; Luk, Ting S.; Smith, Sean W.; Fields, Shelby S.; Jaszewski, Samantha T.; Constantin, Costel; Hirt, Daniel M.; Riffe, Will T.; Bender, Scott; Ayyasamy, Mukil V.; Balachandran, Prasanna V.; Lu, Ping; Henry, Michael David; Davids, Paul S., 2020, "Complex Refractive Index of Hafnium Zirconium Oxide (Hf1-xZrxO2, 0≤x≤1)", https://doi.org/10.18130/V3/KGK8MW, University of Virginia Dataverse, V1, UNF:6:oEvrgujo4clrL4no/7x7bQ== [fileUNF]
This dataset contains the complex refractive index calculated from spectroscopic ellipsometry data collected on 20 nm thick hafnium zirconium oxide films subjected to a 600 degree Celsius rapid thermal anneal that are reported in "Compositional dependence of linear and nonlinear optical response in crystalline hafnium zirconium oxide thin films," J... |
Tabular Data - 16.0 KB - 3 Variables, 705 Observations - UNF:6:wso0ehKo6qFGO+zhEswq/A==
Complex refractive index of HfO2. |
