Ihlefeld Research Group

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1 to 3 of 3 Results

Temperature Dependent Lattice Parameters and Coefficent of Thermal Expansion for Tantalum Nitride Aug 22, 2024 Lenox, Megan K.; Skidmore, Chloe H.; Salanova, Alejandro; Maria, Jon-Paul; Ihlefeld, Jon F., 2024, "Temperature Dependent Lattice Parameters and Coefficent of Thermal Expansion for Tantalum Nitride", https://doi.org/10.18130/V3/BUWWQB, University of Virginia Dataverse, V1, UNF:6:YE4+00QsgpPSZKFDN2vBSg== [fileUNF] This dataset contains Rietveld refined lattice parameters for hexagonal tantalum nitride. The tantalum nitride powder was sourced from Thermo Scientific CAS 12033-62-4. X-Ray diffraction data was collected using a Malvern Panalytical Empyrean II X-Ray diffractometer with copper K...
Lattice Parameters and CTE Tensor Components of Rare Earth Disilicates Apr 7, 2022 Salanova, Alejandro; Brummel, Ian A.; Yakovenko, Andrey A.; Opila, Beth J.; Ihlefeld, Jon F., 2022, "Lattice Parameters and CTE Tensor Components of Rare Earth Disilicates", https://doi.org/10.18130/V3/XI7QGF, University of Virginia Dataverse, V1, UNF:6:oAdZunzjXbudbcywGS+lxg== [fileUNF] This dataset contains analyzed X-Ray diffraction data collected at Argonne National Lab's Advanced Photon Source Beamline 11-ID-C. High temperature diffraction measurements from room temperature to 1000 degrees Celsius were sequentially refined using GSAS-II. The lattice paramete...
Complex Refractive Index of Hafnium Zirconium Oxide (Hf1-xZrxO2, 0≤x≤1) Jul 10, 2020 Ihlefeld, Jon; Luk, Ting S.; Smith, Sean W.; Fields, Shelby S.; Jaszewski, Samantha T.; Constantin, Costel; Hirt, Daniel M.; Riffe, Will T.; Bender, Scott; Ayyasamy, Mukil V.; Balachandran, Prasanna V.; Lu, Ping; Henry, Michael David; Davids, Paul S., 2020, "Complex Refractive Index of Hafnium Zirconium Oxide (Hf1-xZrxO2, 0≤x≤1)", https://doi.org/10.18130/V3/KGK8MW, University of Virginia Dataverse, V1, UNF:6:oEvrgujo4clrL4no/7x7bQ== [fileUNF] This dataset contains the complex refractive index calculated from spectroscopic ellipsometry data collected on 20 nm thick hafnium zirconium oxide films subjected to a 600 degree Celsius rapid thermal anneal that are reported in "Compositional dependence of linear and nonlinear...

Temperature Dependent Lattice Parameters and Coefficent of Thermal Expansion for Tantalum Nitride

Aug 22, 2024

Lenox, Megan K.; Skidmore, Chloe H.; Salanova, Alejandro; Maria, Jon-Paul; Ihlefeld, Jon F., 2024, "Temperature Dependent Lattice Parameters and Coefficent of Thermal Expansion for Tantalum Nitride", https://doi.org/10.18130/V3/BUWWQB, University of Virginia Dataverse, V1, UNF:6:YE4+00QsgpPSZKFDN2vBSg== [fileUNF]

This dataset contains Rietveld refined lattice parameters for hexagonal tantalum nitride. The tantalum nitride powder was sourced from Thermo Scientific CAS 12033-62-4. X-Ray diffraction data was collected using a Malvern Panalytical Empyrean II X-Ray diffractometer with copper K...

Lattice Parameters and CTE Tensor Components of Rare Earth Disilicates

Apr 7, 2022

Salanova, Alejandro; Brummel, Ian A.; Yakovenko, Andrey A.; Opila, Beth J.; Ihlefeld, Jon F., 2022, "Lattice Parameters and CTE Tensor Components of Rare Earth Disilicates", https://doi.org/10.18130/V3/XI7QGF, University of Virginia Dataverse, V1, UNF:6:oAdZunzjXbudbcywGS+lxg== [fileUNF]

This dataset contains analyzed X-Ray diffraction data collected at Argonne National Lab's Advanced Photon Source Beamline 11-ID-C. High temperature diffraction measurements from room temperature to 1000 degrees Celsius were sequentially refined using GSAS-II. The lattice paramete...

Complex Refractive Index of Hafnium Zirconium Oxide (Hf1-xZrxO2, 0≤x≤1)

Jul 10, 2020

Ihlefeld, Jon; Luk, Ting S.; Smith, Sean W.; Fields, Shelby S.; Jaszewski, Samantha T.; Constantin, Costel; Hirt, Daniel M.; Riffe, Will T.; Bender, Scott; Ayyasamy, Mukil V.; Balachandran, Prasanna V.; Lu, Ping; Henry, Michael David; Davids, Paul S., 2020, "Complex Refractive Index of Hafnium Zirconium Oxide (Hf1-xZrxO2, 0≤x≤1)", https://doi.org/10.18130/V3/KGK8MW, University of Virginia Dataverse, V1, UNF:6:oEvrgujo4clrL4no/7x7bQ== [fileUNF]

This dataset contains the complex refractive index calculated from spectroscopic ellipsometry data collected on 20 nm thick hafnium zirconium oxide films subjected to a 600 degree Celsius rapid thermal anneal that are reported in "Compositional dependence of linear and nonlinear...

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