1 to 5 of 5 Results
Apr 7, 2022 - Ihlefeld Research Group
Salanova, Alejandro; Brummel, Ian A.; Yakovenko, Andrey A.; Opila, Beth J.; Ihlefeld, Jon F., 2022, "Lattice Parameters and CTE Tensor Components of Rare Earth Disilicates", https://doi.org/10.18130/V3/XI7QGF, University of Virginia Dataverse, V1, UNF:6:oAdZunzjXbudbcywGS+lxg== [fileUNF]
This dataset contains analyzed X-Ray diffraction data collected at Argonne National Lab's Advanced Photon Source Beamline 11-ID-C. High temperature diffraction measurements from room temperature to 1000 degrees Celsius were sequentially refined using GSAS-II. The lattice paramete... |
Sep 30, 2020
Hoglund, Eric, 2020, "Crystallographic, Electronic, and Phononic Properties of SrTiO3-CaTiO3 Superlattices Versus Layer Thickness", https://doi.org/10.18130/V3/UVTOHO, University of Virginia Dataverse, V1
Figures for "Crystallographic, Electronic, and Phononic Properties of SrTiO3-CaTiO3 Superlattices Versus Layer Thickness" |
Jul 10, 2020 - Ihlefeld Research Group
Ihlefeld, Jon; Luk, Ting S.; Smith, Sean W.; Fields, Shelby S.; Jaszewski, Samantha T.; Constantin, Costel; Hirt, Daniel M.; Riffe, Will T.; Bender, Scott; Ayyasamy, Mukil V.; Balachandran, Prasanna V.; Lu, Ping; Henry, Michael David; Davids, Paul S., 2020, "Complex Refractive Index of Hafnium Zirconium Oxide (Hf1-xZrxO2, 0≤x≤1)", https://doi.org/10.18130/V3/KGK8MW, University of Virginia Dataverse, V1, UNF:6:oEvrgujo4clrL4no/7x7bQ== [fileUNF]
This dataset contains the complex refractive index calculated from spectroscopic ellipsometry data collected on 20 nm thick hafnium zirconium oxide films subjected to a 600 degree Celsius rapid thermal anneal that are reported in "Compositional dependence of linear and nonlinear... |
Apr 16, 2020
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Oct 16, 2019
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